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Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative Microscopy

Published online by Cambridge University Press:  05 August 2019

C.S. Bonifacio ,
P. Nowakowski ,
K. Costello ,
M.L. Ray ,
R. Morrison  and
P.E. Fischione
C.S. Bonifacio
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
P. Nowakowski
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
K. Costello
Affiliation:
Quorum Technologies Ltd., East Sussex, UK
M.L. Ray
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
R. Morrison
Affiliation:
Quorum Technologies Ltd., East Sussex, UK
P.E. Fischione
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA

Abstract

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Type
New Frontiers in Atom Probe Tomography Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2554 - 2555
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Bonifacio, CS et al. , Microscopy and Microanalysis 23 (2017), p. 268.Google Scholar
[2]Bonifacio, CS et al. , Microscopy and Microanalysis 24 (2018), p. 1118.Google Scholar
[3]Bonifacio, CS et al. , 19th International Microscopy Congress (2018), p. 669.Google Scholar
[4]Perea, DE et al. , Advanced Structural and Chemical Imaging 3 (2017), p. 12.Google Scholar
[5]Thompson, K et al. , Ultramicroscopy 107 (2007), p. 131.Google Scholar