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Practical Aspects for Reliable Standardless Quantification in Energy Dispersive X-ray Spectrometry

Published online by Cambridge University Press:  30 July 2020

Philippe Pinard ,
Simon Burgess ,
Alan Protheroe ,
Rosie Jones  and
Peter Statham
Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Alan Protheroe
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Rosie Jones
Affiliation:
Oxford Instruments, High Wycombe, England, United Kingdom
Peter Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom

Abstract

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Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1554 - 1556
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Copyright
Copyright © Microscopy Society of America 2020

References

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Pinard, P et al. , EMAS 2019 Proceedings (2019), 269Google Scholar
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Statham, PJ et al. , IOP Conf. Ser.: Mater. Sci. Eng 109 (2016), 01201610.1088/1757-899X/109/1/012016CrossRefGoogle Scholar