Precision of EBSD based Orientation Measurements

S Wright; M Nowell; J Basinger

doi:10.1017/S143192761100290X

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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HARDIN, T.J. RUGGLES, T.J. KOCH, D.P. NIEZGODA, S.R. FULLWOOD, D.T. and HOMER, E.R. 2015. Analysis of traction‐free assumption in high‐resolution EBSD measurements. Journal of Microscopy, Vol. 260, Issue. 1, p. 73.

Fullwood, David Vaudin, Mark Daniels, Craig Ruggles, Timothy and Wright, Stuart I. 2015. Validation of kinematically simulated pattern HR-EBSD for measuring absolute strains and lattice tetragonality. Materials Characterization, Vol. 107, Issue. , p. 270.

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Wright, Stuart I. Suzuki, Seiichi and Nowell, Matthew M. 2016. In Situ EBSD Observations of the Evolution in Crystallographic Orientation with Deformation. JOM, Vol. 68, Issue. 11, p. 2730.

Orme, Andrew D. Chelladurai, Isaac Rampton, Travis M. Fullwood, David T. Khosravani, Ali Miles, Michael P. and Mishra, Raja K. 2016. Insights into twinning in Mg AZ31: A combined EBSD and machine learning study. Computational Materials Science, Vol. 124, Issue. , p. 353.

Ruggles, T.J. Rampton, T.M. Khosravani, A. and Fullwood, D.T. 2016. The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopy. Ultramicroscopy, Vol. 164, Issue. , p. 1.

Nowell, Matthew M. and Wright, Stuart I. 2017. Thoughts on Standards Materials and Analytical Routines for Electron Backscatter Diffraction (EBSD). Microscopy and Microanalysis, Vol. 23, Issue. S1, p. 510.

Sharma, Nitin Kumar and Shekhar, Shashank 2018. Deconvoluting error in measurement of low angle misorientation distribution. Micron, Vol. 107, Issue. , p. 28.

Ruggles, T.J. Bomarito, G.F. Qiu, R.L. and Hochhalter, J.D. 2018. New levels of high angular resolution EBSD performance via inverse compositional Gauss–Newton based digital image correlation. Ultramicroscopy, Vol. 195, Issue. , p. 85.

Zhu, Chaoyi Kaufmann, Kevin and Vecchio, Kenneth 2019. Automated Reconstruction of Spherical Kikuchi Maps. Microscopy and Microanalysis, Vol. 25, Issue. 4, p. 912.

Winkelmann, Aimo Nolze, Gert Cios, Grzegorz Tokarski, Tomasz and Bała, Piotr 2020. Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps. Materials, Vol. 13, Issue. 12, p. 2816.

Zhu, Chaoyi Kaufmann, Kevin and Vecchio, Kenneth S. 2020. Novel remapping approach for HR-EBSD based on demons registration. Ultramicroscopy, Vol. 208, Issue. , p. 112851.

Shekhar, Shashank Sharma, Nitin Kumar Sahu, Sandeep and Misra, Santanu 2022. Electron Microscopy in Science and Engineering. Vol. 6, Issue. , p. 35.

Ruggles, Timothy Grutzik, Scott J. and Michael, Joseph R. 2022. Determining Stress in Metallic Conducting Layers of Microelectronics Devices Using High Resolution Electron Backscatter Diffraction and Finite Element Analysis. SSRN Electronic Journal ,

Ruggles, Timothy Grutzik, Scott Stephens, Kelly and Michael, Joseph 2023. Determining Stress in Metallic Conducting Layers of Microelectronics Devices Using High Resolution Electron Backscatter Diffraction and Finite Element Analysis. Microscopy and Microanalysis, Vol. 29, Issue. 2, p. 490.

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Precision of EBSD based Orientation Measurements

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