Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-29T07:27:25.596Z Has data issue: false hasContentIssue false
  • English
  • Français

Preparation of Atom Probe Specimens Containing Individual Nanoparticles

Published online by Cambridge University Press:  22 July 2022

Mark McLean  and
Frederick Meisenkothen
Mark McLean*
Affiliation:
Material Measurement Science Division, National Institute of Standards & Technology, Gaithersburg, MD, United States
Frederick Meisenkothen
Affiliation:
Material Measurement Science Division, National Institute of Standards & Technology, Gaithersburg, MD, United States
*
*Corresponding author: mark.mclean@nist.gov

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 70 - 71
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Tedsree, K et al. , Nature Nanotech 6 (2011), p. 302. doi: 10.1038/nnano.2011.42CrossRefGoogle Scholar
Felfer, P et al. , Ultramicroscopy 159 (2015), p. 413. doi: 10.1016/j.ultramic.2015.04.014CrossRefGoogle Scholar
Kim, S-H et al. , Ultramicroscopy 190 (2018), p. 20. doi: 10.1016/j.ultramic.2018.04.005CrossRefGoogle Scholar
Barroo, C et al. Ultramicroscopy 218 (2020), p. 113082. doi: 10.1016/j.ultramic.2020.113082CrossRefGoogle Scholar
Josten, J and Felfer, P, Microscopy and Microanalysis (2021) p. 1-10. doi:10.1017/S1431927621000465CrossRefGoogle Scholar