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Preparation of samples: Why use Ga, Xe or photons?

Published online by Cambridge University Press:  30 July 2021

Joseph Michael
Joseph Michael*
Affiliation:
Sandia National Laboratory, United States

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 16 - 17
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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