We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
[1]Newbury, D.E. & Ritchie, N.W.M.Elemental mapping of microsctructures by scanning electron microscopy-energy dispersive X-ray spectrometry (SEM-EDS): extraordinary advances with the silicon drift detector (SDD). Journal of Analytical Atomic Spectrometry282013). p. 973–988.CrossRefGoogle Scholar
[2]
[2]Scharf, O., Ihle, S., Ordavo, I., et alCompact pnCCD-based X-ray camera with high spatial and energy resolution: A color X-ray camera. Analytical Chemistry832011). p. 2532. 2538.CrossRefGoogle ScholarPubMed