Hostname: page-component-745bb68f8f-d8cs5 Total loading time: 0 Render date: 2025-01-07T14:28:31.074Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantifying Pb in Microelectronic Electrodes to Mitigate Sn Whisker Growth with the Use of Energy Dispersive X-Ray Spectroscopy (EDS) and Image Analysis

Published online by Cambridge University Press:  22 July 2022

Luis Jauregui ,
Rebecca Wheeling  and
Jeier Yang
Luis Jauregui*
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Rebecca Wheeling
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Jeier Yang
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
*
*Corresponding author: ljjaure@sandia.gov

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Quantitative and Qualitative Mapping of Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 564 - 565
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Tu, King-Nigh et al. , Lead-Free Electronic Solders 1 (2006), p 281. doi:10.1007/978-0-387-48433-4_18Google Scholar
Goldstein, Joseph I. et al. , in “Scanning Electron Microscopy and X-Ray Microanalysis”,4th ed. Joseph I. Goldstein et al., (Springer, New York) p.296.Google Scholar
SNL is managed and operated by NTESS under DOE NNSA contract DE-NA0003525.Google Scholar