Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-27T12:31:25.379Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Analyses of Precession Diffraction Data for a Large Cell Oxide

Published online by Cambridge University Press:  22 January 2004

Christopher S. Own ,
Arun K. Subramanian  and
Laurence D. Marks
Christopher S. Own
Affiliation:
Department of Materials Science, Northwestern University, 2220 N. Campus Dr., Cook 2036, Evanston, IL 60201, USA
Arun K. Subramanian
Affiliation:
Department of Materials Science, Northwestern University, 2220 N. Campus Dr., Cook 2036, Evanston, IL 60201, USA
Laurence D. Marks
Affiliation:
Department of Materials Science, Northwestern University, 2220 N. Campus Dr., Cook 2036, Evanston, IL 60201, USA
Get access

Abstract

Kinematical and two-beam calculations have been conducted and are compared to experimental precession data for the large unit cell crystal La4Cu3MoO12. Precession electron diffraction intensities are found to exhibit approximate two-beam behavior and demonstrate clear advantages over conventional SADP intensities for use in structure solution.

Keywords

TEMelectronprecessiondiffractiondirect methods
Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue 1 , February 2004 , pp. 96 - 104
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Berg, B.S., Hansen, V., Midgley, P.A., & Gjønnes, J. (1998). Measurement of three-dimensional intensity data in electron diffraction by the precession technique. Ultramicroscopy 74, 147–157.Google Scholar
Blackman, M. (1939). On the intensities of electron diffraction rings. Proc Roy Soc A 173, 68–82.Google Scholar
Gemmi, M. (2001). Precession technique. In Electron Crystallography and Cryo-Electron Microscopy, Puiggali, J., Rodriguez-Galan, A., Franco, L. & Casas, M.T. (Eds.), pp. L91–L94. Barcelona: Barcelona Universitat Politecnica de Catalunya.
Gjønnes, K. (1997). On the integration of electron diffraction intensities in the Vincent-Midgley precession technique. Ultramicroscopy 69, 1–11.Google Scholar
Kilaas, R. (2003). NCEM Software Resource. Retrieved 01 January, 2003 from http://ncem.lbl.gov/frames/software.htm.
Vander Griend, D.A., Boudin, S., Caignaert, V., Poeppelmeier, K.R., Wang, Y.G., Dravid, V.P., Azuma, M., Takano, M., Hu, Z.B., & Jorgensen, J.D. (1999). La4Cu3MoO12: A novel cuprate with unusual magnetism. J Am Chem Soc 121, 4787.Google Scholar
Vincent, R. & Bird, D.M. (1986). Measurement of kinematic intensities from large-angle electron-diffraction patterns. Phil Mag Lett 53, L35–L40.Google Scholar
Vincent, R., Bird, D.M., & Steeds, J.W. (1984). Structure of AuGeAs determined by convergent-beam electron-diffraction. 2. Refinement of structural parameters. Phil Mag A 50, 765–786.Google Scholar
Vincent, R. & Midgley, P.A. (1994). Double conical beam-rocking system for measurement of integrated electron-diffraction intensities. Ultramicroscopy 53, 271–282.Google Scholar
Xu, P., Jayaram, G., & Marks, L.D. (1994). Cross-correlation method for intensity measurement of transmission. Ultramicroscopy 53, 15–18.Google Scholar