Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-10T05:58:41.684Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis

Published online by Cambridge University Press:  05 August 2019

Ari N. Blumer ,
Jacob T. Boyer ,
Julia I. Deitz ,
Francisco A. Rodriguez  and
Tyler J. Grassman
Ari N. Blumer
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA.
Jacob T. Boyer
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA.
Julia I. Deitz
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA.
Francisco A. Rodriguez
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA.
Tyler J. Grassman*
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA. Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, USA.
*
*Corresponding author: grassman.5@osu.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 202 - 203
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Crimp, MA, Microsc. Res. Tech. 69 (2006), p. 374.Google Scholar
[2]Wilkinson, AJ, J. Electron Microsc. (Tokyo) 49 (2000), p. 299.Google Scholar
[3]Zaefferer, S and Elhami, N-N, Acta Mater. 75 (2014), p. 20.Google Scholar
[4]Picard, YN et al. , Appl. Phys. Lett. 91 (2007), p. 094106.Google Scholar
[5]Naresh-Kumar, G et al. , Phys. Rev. Lett. 108 (2012), p. 135503.Google Scholar
[6]Deitz, JI et al. , J. Vis. Exp. 101 (2015), p. e52745.Google Scholar
[7]Mukherjee, K et al. , Appl. Phys. Lett. 110 (2017), p. 232101.Google Scholar
[8]Sosa, JM et al. , Integrating Mater. Manuf. Innov. 3 (2014), p. 10.Google Scholar