Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-28T16:11:56.386Z Has data issue: false hasContentIssue false

Quantitative Measurement and Utilization of Electron Irradiation Effects in 2D Materials

Published online by Cambridge University Press:  30 July 2020

Gregor Leuthner
Affiliation:
University of Vienna, Vienna, Wien, Austria
Thuy An Bui
Affiliation:
University of Vienna, Vienna, Wien, Austria
Georg Zagler
Affiliation:
University of Vienna, Vienna, Wien, Austria
Bernhard Fickl
Affiliation:
University of Vienna, Vienna, Wien, Austria
Mohammad Monazam
Affiliation:
University of Vienna, Vienna, Wien, Austria
Alexandru Chirita
Affiliation:
University of Vienna, Vienna, Wien, Austria
Toma Susi
Affiliation:
University of Vienna, Vienna, Wien, Austria
Jani Kotakoski
Affiliation:
University of Vienna, Vienna, Wien, Austria

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
New Frontiers in Electron Microscopy of Two-Dimensional Materials
Copyright
Copyright © Microscopy Society of America 2020

References

Susi, , Meyer, , Kotakoski, , Nat. Rev. Phys. 1, 397 (2019)10.1038/s42254-019-0058-yCrossRefGoogle Scholar
Meyer, et al. Phys. Rev. Lett. 108, 196102 (2012)10.1103/PhysRevLett.108.196102CrossRefGoogle Scholar
Susi, et al. Nat. Commun. 7, 13040 (2016)10.1038/ncomms13040CrossRefGoogle Scholar
Cretu, , Lin, , Suenaga, , Micron 72, 2127 (2015)10.1016/j.micron.2015.02.002CrossRefGoogle Scholar
Zagler, et al. , arXiv:1909.06372 (2019)Google Scholar