Quantitative X-ray Microanalysis of Particles at Low Beam Energy

John A. Small

doi:10.1017/S1431927603444966

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Quantitative X-ray Microanalysis of Particles at Low Beam Energy

Published online by Cambridge University Press: 24 July 2003

John A. Small

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John A. Small*: Affiliation:
NIST, Surface and Microanalysis Science Division, Gaithersburg, MD 20899-8371

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Information: Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 992 - 993

DOI: https://doi.org/10.1017/S1431927603444966 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2003

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Quantitative X-ray Microanalysis of Particles at Low Beam Energy

Volume 9, Issue S02
John A. Small ^(a1)
DOI: https://doi.org/10.1017/S1431927603444966

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Quantitative X-ray Microanalysis of Particles at Low Beam Energy

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