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Recent Advances of the Open Source MULTEM Program to Provide Accurate and Fast Electron Microscopy Simulations

Published online by Cambridge University Press:  04 August 2017

I.P. Lobato Hoyos ,
J. Verbeeck  and
S. Van Aert
I.P. Lobato Hoyos
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp, Belgium.
J. Verbeeck
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp, Belgium.
S. Van Aert
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp, Belgium.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 206 - 207
Copyright
© Microscopy Society of America 2017 

References

[1] Kisielowski, C., et al, Microscopy and Microanalysis 14 2008). p. 469.CrossRefGoogle Scholar
[2] Nellist, P.D. Science 305 2004). p. 1741.CrossRefGoogle Scholar
[3] Kirkland, E.J. in Advanced Computing in Electron Microscopy (ed. SecondSpringer New York and Londonp. 184.Google Scholar
[4] Verbeeck, J., Schattschneider, P. & Rosenauer, A. Ultramicroscopy 109 2009). p 305.Google Scholar
[5] Lobato, I., Van Aert, S. & Verbeeck, J. Ultramicroscopy 168 2016). p 17.CrossRefGoogle Scholar
[6] The authors acknowledge financial support from the European Union under the Seventh Framework Program under a contract for an Integrated Infrastructure Initiative. Reference No. 312483-ESTEEM2. The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through project fundings (G.0374.13N, G.0369.15N and G.0368.15N).Google Scholar