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Recording 4D-STEM Datasets at a Range of Beam Tilts Simultaneously with Multi-Beam Electron Diffraction

Published online by Cambridge University Press:  30 July 2020

Colin Ophus ,
Xuhao Hong ,
Steven Zeltmann ,
Karen Bustillo ,
Rohan Dhall ,
Benjamin Savitzky ,
Alexander Mueller  and
Andrew Minor
Colin Ophus
Affiliation:
Lawrence Berkeley National Lab, Berkeley, California, United States
Xuhao Hong
Affiliation:
Nanjing University, Nanjing, Jiangsu, China (People's Republic)
Steven Zeltmann
Affiliation:
University of California - Berkeley, Berkeley, California, United States
Karen Bustillo
Affiliation:
National Center for Electron Microscopy (NCEM), Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, United States
Rohan Dhall
Affiliation:
Molecular Foundry, Lawrence Berkeley National Lab, Berkeley, California, United States,
Benjamin Savitzky
Affiliation:
National Center for Electron Microscopy (NCEM), Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, United States
Alexander Mueller
Affiliation:
National Center for Electron Microscopy (NCEM), Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, United States
Andrew Minor
Affiliation:
Lawrence Berkeley National Lab, Berkeley, California, United States University of California - Berkeley, Berkeley, California, United States

Abstract

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Type
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 712 - 713
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Copyright
Copyright © Microscopy Society of America 2020

References

Ophus, C, Microscopy and Microanalysis 25, 563 (2019).10.1017/S1431927619000497CrossRefGoogle Scholar
Williams and Carter, Transmission electron microscopy: Diffraction, Imaging, and Spectrometry, Springer (2016).Google Scholar
Vincent, R and Midgley, P, Ultramicroscopy 53, 271 (1994).10.1016/0304-3991(94)90039-6CrossRefGoogle Scholar
Midgley, P and Eggeman, AS, IUCrJ, 2, 126 (2015).10.1107/S2052252514022283CrossRefGoogle Scholar
Zeltmann, SE et al. ., Ultramicroscopy 209, 112890 (2020).10.1016/j.ultramic.2019.112890CrossRefGoogle Scholar
Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. CO acknowledges additional support from the U.S. Department of Energy Early Career Research Award Program. SEZ was supported by STROBE, a NSF Science and Technology Center. BHS acknowledges support from the Toyota Research Institute.Google Scholar