Relocating Features Across Microanalytical Instrumentation

Extract

The ability to investigate a particular feature or region of a specimen using differing kinds of analytic instrumentation can be a very valuable technique. For example, an object viewed under an optical microscope provides color, polarization, and reflectance information which is not available via SEM viewing. Similarly, the SEM with its large depth of field and ability to utilize secondary and backscattered electron contrast mechanisms, and its capability to perform compositional analysis via EDS, provides information which the optical microscope cannot. Thus, the information provided by the two instruments is complementary.

Desireable though it may be to view the same feature of a specimen via differing instruments, this is often difficult to execute in practice. The difference in contrast mechanisms which makes the excercise valuable may also make it difficult to relate the distinguishing features viewed under one instrument with those viewed in the other. Further, the issue of scale creates a large complication in many practical instances.