Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-10T03:08:43.228Z Has data issue: false hasContentIssue false

Scan Strategies for Electron Energy Loss Spectroscopy at Optical and Vibrational Energies in Perylene Diimide Nanobelts

Published online by Cambridge University Press:  05 August 2019

Sean M. Collins*
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.
Demie M. Kepaptsoglou
Affiliation:
SuperSTEM, Daresbury, UK and Department of Physics, University of York, York, UK.
Duncan N. Johnstone
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.
Tom Willhammar
Affiliation:
Department of Materials and Environmental Chemistry, Stockholm University, Stockholm, Sweden.
Raj Pandya
Affiliation:
Department of Physics, University of Cambridge, Cambridge, UK.
Jeffrey Gorman
Affiliation:
Department of Physics, University of Cambridge, Cambridge, UK.
Richard Friend
Affiliation:
Department of Physics, University of Cambridge, Cambridge, UK.
Akshay Rao
Affiliation:
Department of Physics, University of Cambridge, Cambridge, UK.
Paul A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.
Quentin Ramasse
Affiliation:
SuperSTEM, Daresbury, UK and School of Chemical and Process Engineering and School of Physics, University of Leeds, Leeds, UK.
*
*Corresponding author: smc204@cam.ac.uk

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Che, Y et al. , Chemistry of Materials 21 (2009), p. 2930.Google Scholar
[2]Chaudhuri, D et al. , Nano Letters 11 (2010), p. 488.Google Scholar
[3]Eggeman, A et al. , Nature Materials 12 (2013), p. 1045.Google Scholar
[4]Alexander, J et al. , Journal of Materials Chemistry A 4 (2016), p. 13636.Google Scholar
[5]SMC gratefully acknowledges support from the Microanalysis Society Goldstein Scholar Award and the Henslow Research Fellowship at Girton College, Cambridge. P.A.M. acknowledges support from the EPSRC (EP/R025517). SuperSTEM is the UK National Research Facility for Advanced Electron Microscopy, supported by EPSRC. The research was also supported by the European Research Council (291522-3DIMAGE and 670405-EXMOLS).Google Scholar