Hostname: page-component-cd9895bd7-gvvz8 Total loading time: 0 Render date: 2024-12-29T02:59:58.543Z Has data issue: false hasContentIssue false

The Scanning Low Energy Electron Microscopy (SLEEM) Mode in SEM

Published online by Cambridge University Press:  31 July 2006

L Frank
Affiliation:
Institute of Scientific Instruments,Czech Repubic
I Mullerova
Affiliation:
Institute of Scientific Instruments,Czech Repubic
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Research Article
Copyright
© 2006 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)