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Secondary Fluorescence Correction for Characteristic and Bremsstrahlung X-Rays Using Monte Carlo X-ray Depth Distributions Applied to Bulk and Multilayer Materials

Published online by Cambridge University Press:  14 March 2019

Yu Yuan Open the ORCID record for Yu Yuan [Opens in a new window] ,
Hendrix Demers ,
Samantha Rudinsky  and
Raynald Gauvin
Yu Yuan
Affiliation:
Department of Mining and Materials Engineering, McGill University, 3610 Rue University, Montreal, Quebec, H3A 0C5, Canada
Hendrix Demers
Affiliation:
Centre d'excellence en électrification des transports et stockage d’énergie, IREQ, 1806 Boulevard Lionel-Boulet, Varennes, Québec, J3X 1S1, Canada
Samantha Rudinsky
Affiliation:
Department of Mining and Materials Engineering, McGill University, 3610 Rue University, Montreal, Quebec, H3A 0C5, Canada
Raynald Gauvin*
Affiliation:
Department of Mining and Materials Engineering, McGill University, 3610 Rue University, Montreal, Quebec, H3A 0C5, Canada
*
*Author for correspondence: Raynald Gauvin, E-mail: raynald.gauvin@mcgill.ca
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Abstract

Secondary fluorescence effects are important sources of characteristic X-ray emissions, especially for materials with complicated geometries. Currently, three approaches are used to calculate fluorescence X-ray intensities. One is using Monte Carlo simulations, which are accurate but have drawbacks such as long computation times. The second one is to use analytical models, which are computationally efficient, but limited to specific geometries. The last approach is a hybrid model, which combines Monte Carlo simulations and analytical calculations. In this article, a program is developed by combining Monte Carlo simulations for X-ray depth distributions and an analytical model to calculate the secondary fluorescence. The X-ray depth distribution curves of both the characteristic and bremsstrahlung X-rays obtained from Monte Carlo program MC X-ray allow us to quickly calculate the total fluorescence X-ray intensities. The fluorescence correction program can be applied to both bulk and multilayer materials. Examples for both cases are shown. Simulated results of our program are compared with both experimental data from the literature and simulation data from PENEPMA and DTSA-II. The practical application of the hybrid model is presented by comparing with the complete Monte Carlo program.

Keywords

Monte Carlomultilayer materialsquantitative X-ray microanalysissecondary fluorescenceX-ray depth distribution
Type
Materials Science Applications
Information
Microscopy and Microanalysis , Volume 25 , Issue 1 , February 2019 , pp. 92 - 104
Copyright
Copyright © Microscopy Society of America 2019 

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