Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-29T07:02:30.993Z Has data issue: false hasContentIssue false
  • English
  • Français

Secondary Fluorescence Correction for Quantitative X-ray Microanalysis Integrated in a User-Friendly Framework

Published online by Cambridge University Press:  30 July 2020

Yu Yuan ,
Hendrix Demers ,
Samantha Rudinsky ,
Nicolas Brodusch ,
Mathieu Gendron ,
Eric Yen ,
Sabrina Clusiau ,
Nicolas Piché  and
Raynald Gauvin
Yu Yuan
Affiliation:
McGill University, Montreal, Quebec, Canada
Hendrix Demers
Affiliation:
Centre d'excellence en électrification des transports et stockage d’énergie, Hydro-Québec, Varennes, Quebec, Canada
Samantha Rudinsky
Affiliation:
Steam Instruments, Montreal, Quebec, Canada
Nicolas Brodusch
Affiliation:
McGill University, Montreal, Quebec, Canada
Mathieu Gendron
Affiliation:
Object Research Systems, Montreal, Quebec, Canada
Eric Yen
Affiliation:
Object Research Systems, Montreal, Quebec, Canada
Sabrina Clusiau
Affiliation:
Object Research Systems, Montreal, Quebec, Canada
Nicolas Piché
Affiliation:
Object Research Systems, Montreal, Quebec, Canada
Raynald Gauvin
Affiliation:
McGill University, Montreal, Quebec, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 500 - 502
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Goldstein, J. I., et al. , Scanning electron microscopy and X-ray microanalysis, Springer (2017).Google Scholar
Yuan, Y., et al. , Microscopy and Microanalysis (2020) (Under review).Google Scholar
Yuan, Y., et al. , Microscopy and Microanalysis 25 (1) (2019), p. 92–104.10.1017/S1431927618016215CrossRefGoogle Scholar
Gauvin, R. and Michaud, P, Microscopy and Microanalysis 15 (2009), p. 488–489.10.1017/S1431927609092423CrossRefGoogle Scholar
Rudinsky, S., et al. , Microscopy and Microanalysis 25 (S2)(2019): p.222–223.10.1017/S1431927619001843CrossRefGoogle Scholar
Piché, N., et al. , Microscopy and Microanalysis 24 (Suppl 1) (2018), p. 560–561.10.1017/S143192761800329XCrossRefGoogle Scholar