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Simplifying Electron Beam Channeling in STEM

Published online by Cambridge University Press:  04 August 2017

Ryan J. Wu ,
Anudha Mittal ,
Michael L. Odlyzko  and
K. Andre Mkhoyan
Ryan J. Wu
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, MN, USA
Anudha Mittal
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, MN, USA
Michael L. Odlyzko
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, MN, USA
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, MN, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 410 - 411
Copyright
© Microscopy Society of America 2017 

References

[1] Kourkoutis, L. F., et al, Physical Review B 84 2011 075485.Google Scholar
[2] Op de Beeck, M. & Van Dyck, D. Ultramicroscopy 64 1996). pg 153–165.Google Scholar
[3] Pennycook, S. J. Ultramicroscopy 26 1988). pg 239–248.Google Scholar
[4] Kirkland, E. J. Advanced Computing in Electron Microscopy, 2nd ed New York 2010.Google Scholar
[5] The authors gratefully acknowledge funding provided by C-SPIN, one of six centers of STARnet, a Semiconductor Research Corporation program, sponsored by MARCO and DARPA.Google Scholar