Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-14T06:35:48.470Z Has data issue: false hasContentIssue false
  • English
  • Français

SIMS on FIB Instruments: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics

Published online by Cambridge University Press:  23 September 2015

T. Wirtz ,
D. Dowsett ,
P. Philipp ,
J.-N. Audinot  and
S. Eswara Moorthy
T. Wirtz
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg
D. Dowsett
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg
P. Philipp
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg
J.-N. Audinot
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg
S. Eswara Moorthy
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2319 - 2320
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Philipp, P. et al., Int. J. Mass. Spectrom. 253 (2006) 71.Google Scholar
[2] Wirtz, T. et al., Appl. Phys. Lett. 101 (2012) 041601.Google Scholar
[3] Pillatsch, L. et al., Appl. Surf Sci. 282 (2013) 90.Google Scholar