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Simulation Analysis of Atomic Scale Optical Imaging by Combing Photoexcitation and Electron Microscopy

Published online by Cambridge University Press:  30 July 2020

Ze Zhang ,
Archith Rayabharam ,
Joel Martis ,
Haokun Li ,
Narayana Aluru  and
Arun Majumdar
Ze Zhang
Affiliation:
Stanford University, Stanford, California, United States
Archith Rayabharam
Affiliation:
UIUC, Urbana, Illinois, United States
Joel Martis
Affiliation:
Stanford University, Stanford, California, United States
Haokun Li
Affiliation:
Stanford University, Stanford, California, United States
Narayana Aluru
Affiliation:
UIUC, Urbana, Illinois, United States
Arun Majumdar
Affiliation:
Stanford University, Stanford, California, United States

Abstract

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Type
In situ TEM at the Extremes - Multi-beam
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1122 - 1125
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Copyright
Copyright © Microscopy Society of America 2020

References

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