Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-27T12:45:01.987Z Has data issue: false hasContentIssue false
  • English
  • Français

Simulation Study of Aberration-Corrected High-Resolution Transmission Electron Microscopy Imaging of Few-Layer-Graphene Stacking

Published online by Cambridge University Press:  26 January 2010

Florence Nelson ,
Alain C. Diebold  and
Robert Hull
Florence Nelson*
Affiliation:
Optical Physics Group, College of Nanoscale Science and Engineering, University of Albany, 255 Fuller Rd., Albany, NY 12203, USA
Alain C. Diebold
Affiliation:
Optical Physics Group, College of Nanoscale Science and Engineering, University of Albany, 255 Fuller Rd., Albany, NY 12203, USA
Robert Hull
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, 110 8th St., Troy, NY 12180, USA
*
Corresponding author. E-mail: FNelson@uamail.albany.edu
Get access

Abstract

Graphene is a single layer of carbon atoms arranged in a hexagonal lattice. The high carrier mobility and mechanical robustness of single layer graphene make it an attractive material for “beyond CMOS” devices. The current work investigates through high-resolution transmission electron microscopy (HRTEM) image simulation the sensitivity of aberration-corrected HRTEM to the different graphene stacking configurations AAA/ABA/ABC as well as bilayers with rotational misorientations between the individual layers. High-angle annular dark field–scanning transmission electron microscopy simulation is also explored. Images calculated using the multislice approximation show discernable differences between the stacking sequences when simulated with realistic operating parameters in the presence of low random noise.

Keywords

graphenesimulationsHRTEMHAADF-STEMstacking configurationsaberration correction
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 16 , Issue 2 , April 2010 , pp. 194 - 199
Copyright
Copyright © Microscopy Society of America 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Aoki, M. & Amawashi, H. (2007). Dependence of band structures on stacking and field in layered graphene. Solid State Commun 142, 123–127.CrossRefGoogle Scholar
Bals, S., Kilaas, R. & Kisielowski, C. (2005). Nonlinear imaging using annular dark field TEM. Ultramicroscopy 104, 281–289.CrossRefGoogle ScholarPubMed
Carlino, E., Grillo, V. & Palazzari, P. (2007). Accurate and fast multislice simulations of HAADF image contrast by parallel computing. In Springer Proceedings in Physics 120: Microscopy of Semiconducting Materials 2007, Cullis, A.G. & Midgley, P.A. (Eds.), pp. 177–180. Bristol: Jointly published with Canopus Publishing Limited.Google Scholar
Charlier, J.C., Gonze, X. & Michenaud, J.P. (1994). First-principles study of the stacking effect on the electronic properties of graphite(s). Carbon 32, 289–299.CrossRefGoogle Scholar
Cowley, J.M. & Moodie, A.F. (1957). The scattering of electrons by atoms and crystals. A new theoretical approach. Acta Crystallogr 10, 609–623.CrossRefGoogle Scholar
Gass, M.H., Bangert, U., Bleloch, A.L., Wang, P., Nair, R.R. & Geim, A.K. (2008). Free-standing graphene at atomic resolution. Nat Nanotechnol 3, 676–681.CrossRefGoogle ScholarPubMed
Hass, J., Varchon, F., Millan-Otoya, J.E., Sprinkle, M., Sharma, N., De Heer, W.A., Berger, C., First, P.N., Magaud, L. & Conrad, E.H. (2008). Why multilayer graphene on 4H-SiC(000-1) behaves like a single sheet of graphene. Phys Rev Lett 100, 125504.Google Scholar
Kilaas, R.CrystalKitX computer program. Version 1.9.2. Berkeley, CA: Total Resolution. Accompanied by 1 manual.Google Scholar
Kilaas, R.MacTempas computer program. Version 2.2.0. Berkeley, CA: Total Resolution. Accompanied by 1 manual.Google Scholar
Kirkland, E.J. (1998). Multislice application and examples. In Advanced Computing in Electron Microscopy, pp. 133–155. New York: Plenum Press.CrossRefGoogle Scholar
Latil, S. & Henrard, L. (2006). Charge carriers in few-layer graphene films. Phys Rev Lett 97, 036803.CrossRefGoogle ScholarPubMed
Latil, S., Meunier, V. & Henrard, L. (2007). Massless fermions in multilayer graphitic systems with misoriented layers: Ab initio calculations and experimental fingerprints. Phys Rev B 76, 201402.CrossRefGoogle Scholar
Li, Z.Y., Young, N.P., Di Vece, M., Palomba, S., Palmer, R.E., Bleloch, R.E., Curley, B.C., Johnston, R.L., Jiang, J. & Yuan, J. (2008). Three-dimensional atomic-scale structure of size-selected gold nanoclusters. Nature 451, 46–49.CrossRefGoogle ScholarPubMed
Lopes dos Santos, J.M.B., Peres, N.M.R. & Castro Neto, A.H. (2007). Graphene bilayer with a twist: Electronic structure. Phys Rev Lett 99, 256802.CrossRefGoogle ScholarPubMed
Meyer, J.C., Kisielowski, C., Erni, R., Rossell, M.D., Crommie, M.F. & Zettl, A. (2008). Direct imaging of lattice atoms and topological defects in graphene membranes. Nano Lett 8, 3582–3586.CrossRefGoogle ScholarPubMed
Palser, A.H.R. (1999). Interlayer interactions in graphite and carbon nanotubes. Phys Chem Chem Phys 1, 4459–4464.CrossRefGoogle Scholar
Rasband, W.ImageJ computer program. Version 1.41o. Bethesda, MD: U.S. National Institutes of Health.Google Scholar
Tewary, V. (2009). Singular behavior of the Debye-Waller factor of graphene. Phys Rev B 79, 125416.CrossRefGoogle Scholar
Warner, J.H., Rummeli, M.H., Gemming, T., Buchner, B. & Briggs, G.A.D. (2009). Direct imaging of rotational stacking faults in few layer graphene. Nano Lett 9, 102–106.CrossRefGoogle ScholarPubMed