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Simultaneous Scanning Electron Microscope Imaging of Topographical and Chemical Contrast Using In-Lens, In-Column, and Everhart–Thornley Detector Systems

Published online by Cambridge University Press:  04 May 2016

Xinming Zhang ,
Xi Cen ,
Rijuta Ravichandran ,
Lauren A. Hughes  and
Klaus van Benthem
Xinming Zhang
Affiliation:
Department of Materials Science and Engineering, University of California, Davis, CA 95616, USA
Xi Cen
Affiliation:
Department of Materials Science and Engineering, University of California, Davis, CA 95616, USA
Rijuta Ravichandran
Affiliation:
Center for Nano-MicroManufacturing, University of California, Davis, CA 95616, USA
Lauren A. Hughes
Affiliation:
Department of Materials Science and Engineering, University of California, Davis, CA 95616, USA
Klaus van Benthem*
Affiliation:
Department of Materials Science and Engineering, University of California, Davis, CA 95616, USA
*
*Corresponding author.Benthem@ucdavis.edu
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Abstract

The scanning electron microscope provides a platform for subnanometer resolution characterization of material morphology with excellent topographic and chemical contrast dependent on the used detectors. For imaging applications, the predominantly utilized signals are secondary electrons (SEs) and backscattered electrons (BSEs) that are emitted from the sample surface. Recent advances in detector technology beyond the traditional Everhart–Thornley geometry have enabled the simultaneous acquisition and discrimination of SE and BSE signals. This study demonstrates the imaging capabilities of a recently introduced new detector system that consists of the combination of two in-lens (I-L) detectors and one in-column (I-C) detector. Coupled with biasing the sample stage to reduce electron–specimen interaction volumes, this trinity of detector geometry allows simultaneous acquisition of signals to distinguish chemical contrast from topographical changes of the sample, including the identification of surface contamination. The I-C detector provides 4× improved topography, whereas the I-L detector closest to the sample offers excellent simultaneous chemical contrast imaging while not limiting the minimization of working distance to obtain optimal lateral resolution. Imaging capabilities and contrast mechanisms for all three detectors are discussed quantitatively in direct comparison to each other and the conventional Everhart–Thornley detector.

Keywords

backscattered electronssecondary electronsSEMin-lens detectorin-column detector
Type
Technique and Instrumentation Development
Information
Microscopy and Microanalysis , Volume 22 , Issue 3 , June 2016 , pp. 565 - 575
Copyright
Copyright © Microscopy Society of America 2016

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