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Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
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[5]This work was supported by Air Force Research Laboratory grant FA8650-15-2-5518 and the National Science Foundation Graduate Research Fellowship Program, and partially supported by Air Force Office of Scientific Research award number FA9550-17-1-0348 and Army Research Office MURI grant W911NF1810200. This work made use of the Electron Probe Instrumentation Center and BioCryo facilities of Northwestern University's NUANCE Center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1720139) at the Materials Research Center; the International Institute for Nanotechnology (IIN); the Keck Foundation; and the State of Illinois, through the IIN.Google Scholar