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Standardless EDS Composition Analysis using Quantitative Annular Dark-Field Imaging

Published online by Cambridge University Press:  04 August 2017

J. Houston Dycus ,
Weizong Xu  and
James M. LeBeau
J. Houston Dycus
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA
Weizong Xu
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 512 - 513
Copyright
© Microscopy Society of America 2017 

References

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[9] JHD, WX and JML acknowledge the Analytical Instrumentation Facility (AIF) at North Carolina State University. JHD acknowledges support by the National Science Foundation Graduate Research Fellowship (Grant DGE-1252376).Google Scholar