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State of the First Aberration-Corrected, Monochromized 200kV FEG-TEM

Published online by Cambridge University Press:  05 September 2003

Gerd Benner ,
Marko Matijevic ,
Alexander Orchowski ,
Bernd Schindler ,
Max Haider  and
Peter Hartel
Bernd Schindler
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl Zeiss S-M-T AG, D-73447 Oberkochen, Germany
Peter Hartel
Affiliation:
CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
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Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 38 - 39
Copyright
Copyright © Microscopy Society of America 2003

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