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STEM and TEM: Disparate Magnification Definitions and a Way Out.

Published online by Cambridge University Press:  04 August 2017

E. Voelkl ,
David Hoyle ,
Jane Howe ,
H. Inada  and
T. Yotsuji
E. Voelkl
Affiliation:
Hitachi High Technologies America, Clarksburg, MD 20871
David Hoyle
Affiliation:
Hitachi High-Technology, Ltd., 89 Rexdale Blvd., Toronto, M9W 6A4Canada
Jane Howe
Affiliation:
Hitachi High Technologies America, Clarksburg, MD 20871
H. Inada
Affiliation:
Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Hitachinaka, Ibaraki 312-8504Japan.
T. Yotsuji
Affiliation:
Science & Medical Systems Business Group, Hitachi High-Technologies Corp., Hitachinaka, Ibaraki 312-8504Japan.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 56 - 57
Copyright
© Microscopy Society of America 2017