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STEM EDS/EELS for Phase Analysis of Deep-Mantle Rock Assemblages Supported by Machine Learning

Published online by Cambridge University Press:  05 August 2019

Hui Chen ,
Farhang Nabiei ,
James Badro ,
Duncan T. L. Alexander  and
Cécile Hébert
Hui Chen*
Affiliation:
Electron Spectrometry and Microscopy Laboratory (LSME), IPHYS, EPFL, Lausanne, Switzerland
Farhang Nabiei
Affiliation:
Electron Spectrometry and Microscopy Laboratory (LSME), IPHYS, EPFL, Lausanne, Switzerland
James Badro
Affiliation:
Earth and Planetary Science Laboratory (EPSL), IPHYS, EPFL, Lausanne, Switzerland Institute de Physique du Globe de Paris, Sorbonne Paris Cité, Paris, France
Duncan T. L. Alexander
Affiliation:
Electron Spectrometry and Microscopy Laboratory (LSME), IPHYS, EPFL, Lausanne, Switzerland
Cécile Hébert
Affiliation:
Electron Spectrometry and Microscopy Laboratory (LSME), IPHYS, EPFL, Lausanne, Switzerland
*
*Corresponding author: hui.chen@epfl.ch

Abstract

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Type
Advances in Characterization of Geological and Extraterrestrial Samples
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2474 - 2475
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Jia, S and Qian, YT, IEEE Transactions on Geoscience and Remote Sensing, 47 (2009), p. 161–173.Google Scholar
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[3]Hirose, K, Sinmyo, R and Hernlund, J, Science, 358 (2017), p. 734–738.Google Scholar