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STEM-EELS Imaging of Resonant Modes in Dielectric Silicon Nanostructures

Published online by Cambridge University Press:  05 August 2019

Valentin Flauraud  and
Duncan T.L. Alexander
Valentin Flauraud
Affiliation:
Electron Spectrometry and Microscopy Laboratory (LSME), Institute of Physics (IPHYS), Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland.
Duncan T.L. Alexander*
Affiliation:
Electron Spectrometry and Microscopy Laboratory (LSME), Institute of Physics (IPHYS), Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland.
*
*Corresponding author: duncan.alexander@epfl.ch

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 634 - 635
Copyright
Copyright © Microscopy Society of America 2019 

References

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[8]We thank the CIME and CMI at EPFL for access to their facilities.Google Scholar