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STEMTooL: An Open Source Python Toolkit for Analyzing Electron Microscopy Datasets

Published online by Cambridge University Press:  30 July 2020

Debangshu Mukherjee  and
Raymond Unocic
Debangshu Mukherjee
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Raymond Unocic
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2960 - 2962
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Copyright
Copyright © Microscopy Society of America 2020

References

Ophus, C. (2019). Microscopy and Microanalysis, 25(3), pp.563-58210.1017/S1431927619000497CrossRefGoogle Scholar
Pekin, T.C., et al. (2017.) Ultramicroscopy, 176, pp.170-176.10.1016/j.ultramic.2016.12.021CrossRefGoogle Scholar
Han, Y., et al. (2018). Nano letters, 18(6), pp.3746-375110.1021/acs.nanolett.8b00952CrossRefGoogle Scholar
Yadav, A.K., et al. (2019). Nature, 565(7740), pp.468-471.10.1038/s41586-018-0855-yCrossRefGoogle Scholar
Müller, K., et al. (2014). Nature communications, 5(1), pp.1-8.Google Scholar
Jiang, Y., et al. (2018). Nature, 559(7714), pp.343-349.10.1038/s41586-018-0298-5CrossRefGoogle Scholar
de la Peña, F., et al. (2017). Microscopy and Microanalysis, 23(S1), pp.214-215.10.1017/S1431927617001751CrossRefGoogle Scholar
Savitzky, B.H., et al. (2019). Microscopy and Microanalysis, 25(S2), pp.124-125.10.1017/S1431927619001351CrossRefGoogle Scholar
Mukherjee, D. (2020). http://doi.org/10.5281/zenodo.3686169.CrossRefGoogle Scholar
Mukherjee, D., et al. (2020). arXiv preprint arXiv:2001.01010.Google Scholar
Research supported by ORNL's Laboratory Directed Research and Development Program, which is managed by UT-Battelle, LLC for the U.S. Department of Energy (DOE). Electron microscopy was conducted as part of a user proposal at Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), which is a U.S. DOE Office of Science User Facility.Google Scholar