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Stroboscopic Imaging Using RF Strip-Line Technology

Published online by Cambridge University Press:  22 July 2022

Spencer A. Reisbick
Affiliation:
Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY 11973, USA
Myung-Geun Han
Affiliation:
Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY 11973, USA
Chuhang Liu
Affiliation:
Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY 11973, USA Department of Physics and Astronomy, Stony Brook University, Stony Brook, NY 11794, USA
Yubin Zhao
Affiliation:
Euclid Techlabs LLC, 365 Remington Blvd. Bolingbrook, IL 60440, USA
Eric Montgomery
Affiliation:
Euclid Techlabs LLC, 365 Remington Blvd. Bolingbrook, IL 60440, USA
Chunguang Jing
Affiliation:
Euclid Techlabs LLC, 365 Remington Blvd. Bolingbrook, IL 60440, USA
Yimei Zhu*
Affiliation:
Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY 11973, USA
*
*Corresponding author: zhu@bnl.gov

Abstract

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Type
General Physical Sciences
Copyright
Copyright © Microscopy Society of America 2022

References

Reisbick, SA, Han, MG, Liu, C, Zhao, Y, Montgomery, E, Jing, C, Gokhale, VJ, Gorman, JJ. Lau, JW, Zhu, Y, "Stroboxcopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscopy", Ultramicroscopy 235, 2002, 113497.CrossRefGoogle Scholar
This work was mainly supported by the DOE-BES Materials Science and Engineering Divisions of under Contract No. DESC0012704.Google Scholar