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Structural and Microanalytical Studies of CrO2 Thin Films on c-Sapphire by High Resolution Electron Microscopy Methods

Published online by Cambridge University Press:  03 October 2008

M.I. Ortiz ,
P.M. Sousa ,
C. Ballesteros ,
A.J. Silvestre ,
L.F. Cohen  and
O. Conde
M.I. Ortiz
Affiliation:
Universidad Carlos III, EPS, Departamento de Física, 28911 Leganés (Madrid), Sp
P.M. Sousa
Affiliation:
Universidade de Lisboa, Departamento de Física e ICEMS, 1749-016 Lisboa, PT
C. Ballesteros
Affiliation:
Universidad Carlos III, EPS, Departamento de Física, 28911 Leganés (Madrid), Sp
A.J. Silvestre
Affiliation:
Instituto Superior de Engenharia de Lisboa e ICEMS, 1959-007 Lisboa, PT
L.F. Cohen
Affiliation:
Imperial College, Department of Physic, Blackett Laboratory, London SW7 2AZ, UK
O. Conde*
Affiliation:
Universidade de Lisboa, Departamento de Física e ICEMS, 1749-016 Lisboa, PT
*
Corresponding author. E-mail: oconde@fc.ul.pt

Abstract

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Chromium dioxide (CrO2) has been extensively used in the magnetic recording industry. However, it is its ferromagnetic half-metallic nature that has more recently attracted much attention, primarily for the development of spintronic devices. CrO2 is the only stoichiometric binary oxide theoretically predicted to be fully spin polarized at the Fermi level. It presents a Curie temperature of ∼ 396 K, i.e. well above room temperature, and a magnetic moment of 2 mB per formula unit. However an antiferromagnetic native insulating layer of Cr2O3 is always present on the CrO2 surface which enhances the CrO2 magnetoresistance and might be used as a barrier in magnetic tunnel junctions.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 14 , Supplement S3 , September 2008 , pp. 47 - 48
Copyright
Copyright © Microscopy Society of America 2008