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Structural Mapping of Disordered Materials by Nanobeam Diffraction Imaging and Multivariate Statistical Analysis

Published online by Cambridge University Press:  11 March 2013

Ping Lu  and
Bryan D. Gauntt
Ping Lu*
Affiliation:
Sandia National Laboratories, Materials Characterization Department, P.O. Box 5800, Albuquerque, NM 87185-1411, USA
Bryan D. Gauntt
Affiliation:
Sandia National Laboratories, Materials Characterization Department, P.O. Box 5800, Albuquerque, NM 87185-1411, USA
*
*Corresponding author. E-mail: plu@sandia.gov
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Abstract

A hybrid nanobeam diffraction/imaging method, which combines well-developed diffraction imaging with nanobeam diffraction (NBD) pattern analysis, is described for structural mapping of disordered materials. Spatially resolved crystallographic information is obtained by NBD imaging by collecting NBD patterns at predefined intervals within a field of interest. The resulting dataset of NBD patterns is preprocessed to produce a spectral-imaging-like dataset and is further analyzed via multivariate statistical analysis methods in order to extract the relevant structural components and their distribution within the area of the sample under study without prior knowledge. Additional radial distribution function analysis of either the principal components or averaged data provides real-space maps of short-range order within the field of interest. This technique is demonstrated for two systems, one with multiple amorphous phases and one with multiple phases (amorphous and nanocrystalline) with similar chemistry.

Keywords

nanobeam diffractionspectral imagingRDFSTEMstructural mappingmultivariate statistical analysisdisordered materials
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 19 , Issue 2 , April 2013 , pp. 300 - 309
Copyright
Copyright © Microscopy Society of America 2013

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