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Study of LEAP® 5000 Deadtime and Precision via Silicon Pre-Sharpened-Microtip™ Standard Specimens

Published online by Cambridge University Press:  28 July 2021

Ty J. Prosa Open the ORCID record for Ty J. Prosa [Opens in a new window]  and
Edward Oltman
Ty J. Prosa*
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711, USA
Edward Oltman
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711, USA
*
*Author for correspondence: Ty J. Prosa, E-mail: ty.prosa@ametek.com
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Abstract

Atom probe tomography (APT) is a technique that has expanded significantly in terms of adoption, dataset size, and quality during the past 15 years. The sophistication used to ensure ultimate analysis precision has not kept pace. The earliest APT datasets were small enough that deadtime and background considerations for processing mass spectrum peaks were secondary. Today, datasets can reach beyond a billion atoms so that high precision data processing procedures and corrections need to be considered to attain reliable accuracy at the parts-per-million level. This paper considers options for mass spectrum ranging, deadtime corrections, and error propagation as applied to an extrinsic-silicon standard specimen to attain agreement for silicon isotopic fraction measurements across multiple instruments, instrument types, and acquisition conditions. Precision consistent with those predicted by counting statistics is attained showing agreement in silicon isotope fraction measurements across multiple instruments, instrument platforms, and analysis conditions.

Keywords

atom probe tomographydeadtimepile-upprecisiontime-of-flight mass spectrometry
Type
Development and Computation
Information
Microscopy and Microanalysis , Volume 28 , Issue 4 , August 2022 , pp. 1019 - 1037
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

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