Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-28T02:10:22.232Z Has data issue: false hasContentIssue false
  • English
  • Français

Taking Full Control: Leveraging Software Customizability and Open-Source Hardware to Tailor FIB Instrument Controls

Published online by Cambridge University Press:  22 July 2022

Aleksander B. Mosberg ,
Iain Godfrey  and
Quentin Ramasse
Aleksander B. Mosberg*
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom
Iain Godfrey
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom
Quentin Ramasse
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom Schools of Chemical and Process Engineering & Physics and Astronomy, University of Leeds, Leeds, United Kingdom
*
*Corresponding author: abmosberg@superstem.org

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 20 - 21
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Melngailis, J, J. Vac. Sci. Technol. B., 5(2) (1987), p. 469. doi: 10.1116/1.583937CrossRefGoogle Scholar
Schaffer, M et al. , Ultramicroscopy 107(8) (2007), p. 587-597. doi: 10.1016/j.ultramic.2006.11.007CrossRefGoogle Scholar
Skoric, L et al. , Nano Letters 20 (1) (2020), p. 184-191. doi: 10.1021/acs.nanolett.9b03565CrossRefGoogle Scholar
Deinhart, V et al. , Beilstein J. Nanotechnol. 12 (2021), p. 304-318. doi: 10.3762/bjnano.12.25CrossRefGoogle Scholar
Klumpe, S et al. , eLife 10 (2021). doi: 10.7554/eLife.70506CrossRefGoogle Scholar
The authors would like to thank Michael Dixon and Hitachi High-Technologies Europe for useful discussions and technical input. SuperSTEM is the UK National Research Facility for Advanced Electron Microscopy, supported by the Engineering and Physical Sciences Research Council (EPSRC).Google Scholar