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Teaching Microscopy Beats Analysis

Published online by Cambridge University Press:  05 August 2019

David B. Williams  and
C. Barry Carter
David B. Williams
Affiliation:
College of Engineering, The Ohio State University, Columbus, OH, USA.
C. Barry Carter
Affiliation:
Department of Chemical & Biomolecular Engineering, UConn, Storrs, CT, USA. Center for Integrated Nanotechnologies, Sandia National Labs, Albuquerque, NM, USA.

Abstract

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Type
The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2266 - 2267
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Goldstein, JI, Williams, DB and Lyman, CE, Ultramicroscopy 28 (1989), p. 56.Google Scholar
[2]Watanabe, M and Williams, DB, Ultramicroscopy 78 (1999), p. 89.Google Scholar
[3]Krivanek, OL et al. , Micros. Microan. Microst. 2 (1991), p. 257.Google Scholar
[4]Williams, DB and Carter, CB in “Transmission Electron Microscopy: A Textbook for Materials Science”, 2nd Ed. (Springer, NY).Google Scholar
[5]Carter, CB and Williams, DB in “Transmission Electron Microscopy: Diffraction, Imaging and Spectrometry”, (Springer, Heidelberg).Google Scholar
[6]Voelkl, E et al. , J. Microsc. 187 (1997), p. 139.Google Scholar
[7]Huber, DA et al. , IMC 19, Sydney, Australia (2018).Google Scholar
[8]Williams, DB and Carter, CB in “Transmission Electron Microscopy: A Textbook for Materials Science” 1st Ed. (Plenum Press, NY), p. 23.Google Scholar
[9]DBW and CBC thank their students, postdocs, friends, colleagues and advisors with whom they have worked over the past 49 years. There may be TMB acronyms but never TM friends, colleagues or collaborators; in fact TM is the essential part of TEM.Google Scholar