Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-14T17:58:17.067Z Has data issue: false hasContentIssue false
  • English
  • Français

TEM Characterization of Ball Milled CIS and CIGS Nanoparticles

Published online by Cambridge University Press:  23 September 2015

I. I. Santana-Garcia ,
C. Kisielowski  and
H. A. Calderon
I. I. Santana-Garcia
Affiliation:
Departamento de Fisica, ESFM-IPN, Mexico D.F. 07338, Mexico
C. Kisielowski
Affiliation:
Molecular Foundry and JCAP, LBNL, One Cyclotron Road, Berkeley, CA 94720, USA
H. A. Calderon
Affiliation:
Departamento de Fisica, ESFM-IPN, Mexico D.F. 07338, Mexico

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2085 - 2086
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Calderon, H.A., Kisielowski, C., Specht, P., Barton, B., Godinez-Salomon, F. & Solorza-Feria, O., Micron 68 (2014). p. 164.CrossRefGoogle Scholar
[2] Electron Microscopy was performed at the Molecular Foundry, which is supported by the Office of Science, Office of Basic Energy Sciences of the U.S. Department of Energy under Contract No.DE-AC02-05CH11231. The research is partially supported by CONACYT (Proyecto FOINST. 75/2012, 148304 and 129207), IPN (COFAA, SIP).Google Scholar