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The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements

Published online by Cambridge University Press:  30 July 2021

Ivo Konvalina ,
Martin Zouhar ,
Benjamin Daniel ,
Aleš Paták ,
Jakub Piňos ,
Luděk Frank ,
Ilona Müllerová  and
Eliška Materna Mikmeková
Ivo Konvalina
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Martin Zouhar
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Benjamin Daniel
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Aleš Paták
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Jakub Piňos
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Luděk Frank
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Ilona Müllerová
Affiliation:
Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic
Eliška Materna Mikmeková
Affiliation:
Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 612 - 615
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Konvalina, I., et al. Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons. Microscopy and Microanalysis, 25(S2), (2019), 482-483; doi:10.1017/S1431927619003143CrossRefGoogle Scholar
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Egerton, R.F. Electron energy-loss spectroscopy in the electron microscope, 2nd ed. (1996), ISBN 978-1-4757-5101-7, Springer Science+Business Media, New York; doi:10.1007/978-1-4757-5099-7Google Scholar
The authors acknowledge funding from the Technology Agency of the Czech Republic (Centre of Electron and Photonic Optics, no. TN01000008).Google Scholar