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Towards Fast and Direct Memory Read-out by Multi-beam Scanning Electron Microscopy and Deep Learning Image Classification

Published online by Cambridge University Press:  05 August 2019

Kyle Crosby ,
Tomasz Garbowski  and
Stephan Nickell
Kyle Crosby
Affiliation:
Carl Zeiss Microscopy LLC, Business Development mSEM, One Zeiss Drive, Thornwood, USA.
Tomasz Garbowski
Affiliation:
Carl Zeiss Microscopy GmbH, Business Development mSEM, Oberkochen, Germany.
Stephan Nickell*
Affiliation:
Carl Zeiss Microscopy GmbH, Business Development mSEM, Oberkochen, Germany.
*
*Corresponding author: Stephan.Nickell@Zeiss.com

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 192 - 193
Copyright
Copyright © Microscopy Society of America 2019 

References

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