Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-14T17:30:44.313Z Has data issue: false hasContentIssue false

Trace Element Detection by X-Ray Fluorescence

Published online by Cambridge University Press:  02 July 2020

M. C. Madden
Affiliation:
Kevex Instruments, 855 Veterans Boulevard, Redwood City, CA, 94063
R. Wong
Affiliation:
Kevex Instruments, 855 Veterans Boulevard, Redwood City, CA, 94063
D. C. Wherry
Affiliation:
Kevex Instruments, 855 Veterans Boulevard, Redwood City, CA, 94063
Get access

Extract

Due primarily to the absence of Bremsstrahlung radiation, fluorescent spectra obtained with x-ray excitation of a sample have a lower background than those obtained with electron excitation. This can be used to detect elements in liquids at very low concentrations under certain conditions. The technique consists of placing a small measured volume of liquid to be analyzed for trace elements on a thin, low atomic number film; evaporating the liquid to dryness; placing it under an x-ray beam; and obtaining a fluorescent spectra. The residue from the evaporated liquid contains any trace elements present, which then produce characteristic peaks in the fluorescent spectrum. These peaks can be used to measure concentrations quantitatively.

This technique has been around for some time, but with detection limits at the parts per million (ppm) level. Although there are many definitions of detection limit, the most commonly used one is from Burton:

Type
Novel X-Ray Methods: From Microscopy to Ultimate Detectability
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Bertin, E. P., Principles and Practice of X-Ray Spectrometric Analysis, New York Plenum (1975)529-32.CrossRefGoogle Scholar