Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-15T01:19:01.307Z Has data issue: false hasContentIssue false
  • English
  • Français

Ultrafast Electron Diffraction for the Dynamical Study of 2D Materials

Published online by Cambridge University Press:  01 August 2018

A. A. Petruk ,
Nicolas Rivas ,
T. Dekker ,
K. Pichugin ,
A. W. Tsen  and
G. Sciaini
A. A. Petruk
Affiliation:
Ultrafast electron Imaging Laboratory (UelL), Department of Chemistry, and Waterloo Institute for Nanotechnology (WIN), University of Waterloo, Waterloo, Canada.
Nicolas Rivas
Affiliation:
Ultrafast electron Imaging Laboratory (UelL), Department of Chemistry, and Waterloo Institute for Nanotechnology (WIN), University of Waterloo, Waterloo, Canada.
T. Dekker
Affiliation:
Department of Electrical and Computer Engineering (ECE), and Institute for Quantum Computing (IQC), University of Waterloo, Waterloo, Canada.
K. Pichugin
Affiliation:
Ultrafast electron Imaging Laboratory (UelL), Department of Chemistry, and Waterloo Institute for Nanotechnology (WIN), University of Waterloo, Waterloo, Canada.
A. W. Tsen
Affiliation:
Department of Chemistry, Institute for Quantum Computing (IQC), and Waterloo Institute for Nanotechnology (WIN), University of Waterloo, Waterloo, Canada.
G. Sciaini
Affiliation:
Ultrafast electron Imaging Laboratory (UelL), Department of Chemistry, and Waterloo Institute for Nanotechnology (WIN), University of Waterloo, Waterloo, Canada.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1598 - 1599
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Gutt, C., et al, Phys. Rev. Lett. 108 2012) p. 024801.Google Scholar
[2] Oudheusden, van T., et al, Phys. Rev. Lett. 105 2010) p. 264801.Google Scholar
[3] Gao, M., et al, Nature 496 2013) p. 343.Google Scholar
[4] Morrison, V. R., et al, Science 346 2014) p. 445.Google Scholar
[5] Otto, M. R., et al, Struct. Dyn. 5 2017) p. 051101.Google Scholar
[6] Petruk, A., et al, Struct. Dyn. 4 2017) p. 044005.Google Scholar
[7] Eichberger, M, et al, Nature 468 2010) p. 799.Google Scholar
[8] Chhowalla, M., et al, Nat. Chem. 5 2013) p. 263.Google Scholar
[9] Tsen, A. W., et al, Proc. Nat. Acad. Sci. 112 2015) p. 15054.Google Scholar
[10] The authors acknowledge funding from the Natural Sciences and Engineering Research Council of Canada. GS acknowledges the funding provided by the Canada Foundation for Innovation.Google Scholar