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Ultrafast TEM and EELS Based on Microwave Cavities

Published online by Cambridge University Press:  30 July 2020

Jom Luiten
Jom Luiten*
Affiliation:
Eindhoven University of Technology, Eindhoven, Noord-Brabant, Netherlands

Abstract

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Type
Advances in Microscopy for Quantum Information Sciences - EELS
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3174
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Copyright
Copyright © Microscopy Society of America 2020

References

Verhoeven, W., van Rens, J.F.M., Kieft, E.R., Mutsaers, P.H.A., and Luiten, O.J., High quality ultrafast transmission electron microscopy using resonant microwave cavities, Ultramicroscopy 188 , 85 (2018)10.1016/j.ultramic.2018.03.012CrossRefGoogle ScholarPubMed
Verhoeven, W., van Rens, J.F.M., van Ninhuijs, M.A.W., Toonen, W.F., Kieft, E.R., Mutsaers, P.H.A., and Luiten, O.J., Time-of-flight electron energy loss spectroscopy using TM110 deflection cavities, Struct. Dyn. 3, 054303 (2016)10.1063/1.4962698CrossRefGoogle ScholarPubMed
Verhoeven, W., van Rens, J.F.M., Toonen, W.F., Kieft, E.R., Mutsaers, P.H.A., and Luiten, O.J., Time-of-flight electron energy loss spectroscopy by longitudinal phase space manipulation with microwave cavities, Struct. Dyn. 5, 051101 (2018)10.1063/1.5052217CrossRefGoogle ScholarPubMed