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Understanding Radiation Damage in Beam-Sensitive TEM Specimens

Published online by Cambridge University Press:  30 July 2020

Ray Egerton
Ray Egerton*
Affiliation:
Department of Physics, University of Alberta, Edmonton, Alberta, Canada

Abstract

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Type
Structural Changes in Hard, Soft, and Biological Samples During Imaging: From Transmission Electron to Helium Ion Microscopy
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 84 - 86
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Copyright
Copyright © Microscopy Society of America 2020

References

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