Hostname: page-component-5f745c7db-tvc9f Total loading time: 0 Render date: 2025-01-06T12:44:59.724Z Has data issue: true hasContentIssue false
  • English
  • Français

Use of Wavelength- and Angle-Resolved Cathodoluminescence for Spectroscopic Analysis of the Emission Pattern of a Nitride Semiconductor Micro Pillar Array

Published online by Cambridge University Press:  05 August 2019

J. Lee ,
M. Bertilson ,
D.J Stowe ,
T Worsley  and
J.A Hunt
J. Lee
Affiliation:
Gatan Inc, Pleasanton, California, United States of America
M. Bertilson
Affiliation:
Gatan Inc, Pleasanton, California, United States of America
D.J Stowe*
Affiliation:
Gatan Inc, Pleasanton, California, United States of America
T Worsley
Affiliation:
Gatan Inc, Pleasanton, California, United States of America
J.A Hunt
Affiliation:
Gatan Inc, Pleasanton, California, United States of America
*
*Corresponding author: dstowe@gatan.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 520 - 521
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Yamamoto, N, The Transmission Electron Microscope, Ed. Maaz, K, (In Tech, 2012).Google Scholar
[2]Bertilson, M et al. , Microscopy and Microanalysis Conference Proceedings (2018).Google Scholar
[3]Ma, M et al. , Apply. Phys. Letts 101, 141105 (2012).Google Scholar