We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Ilett, M. et al. , “Analysis of complex, beam-sensitive materials by transmission electron microscopy and associated techniques,” Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, vol. 378, no. 2186, p. 20190601, Dec. 2020, doi: 10.1098/rsta.2019.0601.CrossRefGoogle Scholar
Krivanek, O. L. et al. , “Vibrational spectroscopy in the electron microscope,” Nature, vol. 514, no. 7521, pp. 209–212, Oct. 2014, doi: 10.1038/nature13870.Google Scholar
[4]
Dwyer, C., Aoki, T., Rez, P., Chang, S. L. Y., Lovejoy, T. C., and Krivanek, O. L., “Electron-Beam Mapping of Vibrational Modes with Nanometer Spatial Resolution,” Phys. Rev. Lett., vol. 117, no. 25, p. 256101, Dec. 2016, doi: 10.1103/PhysRevLett.117.256101.Google ScholarPubMed
[5]
Krivanek, O. L. et al. , “Progress in ultrahigh energy resolution EELS,” Ultramicroscopy, vol. 203, pp. 60–67, Aug. 2019, doi: 10.1016/j.ultramic.2018.12.006.Google Scholar
[6]
The authors acknowledge funding from the Center for Emergent Materials at The Ohio State University, an NSF MRSEC (DMR- 2011876)Google Scholar