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What Can We Learn from the Shapes of Secondary Electron Puddles on Direct Electron Detectors?

Published online by Cambridge University Press:  04 August 2017

Abhik Datta ,
See Wee Chee ,
Benjamin Bammes ,
Liang Jin  and
Duane Loh
Abhik Datta
Affiliation:
Centre for BioImaging Sciences and Department of Biological Sciences, National University of Singapore, Singapore 117557
See Wee Chee
Affiliation:
Centre for BioImaging Sciences and Department of Biological Sciences, National University of Singapore, Singapore 117557 Department of Physics, National University of Singapore, Singapore 117551 Centre for Advanced 2D Materials and Graphene Research Centre, National University of Singapore, Singapore 117546
Benjamin Bammes
Affiliation:
Direct Electron, LP, San Diego, CA, USA92128
Liang Jin
Affiliation:
Direct Electron, LP, San Diego, CA, USA92128
Duane Loh
Affiliation:
Centre for BioImaging Sciences and Department of Biological Sciences, National University of Singapore, Singapore 117557 Department of Physics, National University of Singapore, Singapore 117551

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 190 - 191
Copyright
© Microscopy Society of America 2017 

References

[1]. McMullan, G., Faruqi, A.R., Clare, D., et al., Ultramicroscopy 147, 156–163, 2014.Google Scholar
[2]. McMullana, G., Clark, A.T., Turchetta, R., et al., Ultramicroscopy 109, 1411–1416, 2009.Google Scholar
[3]. Jin, L. & San Diego, UC Electronic Theses and Dissertations 2009 b6636471.Google Scholar
[4]. The authors would like to acknowledge the use of the EM facility at the NUS Center for BioImaging Sciences, and help from Ping Lee Chong and Jian Shi.Google Scholar