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X-Ray Phase Nano-tomography by FZP-based X-Ray Microscopy Combined with Talbot Interferometry

Published online by Cambridge University Press:  10 August 2018

Yanlin Wu ,
Hidekazu Takano ,
Karol Vegso ,
Masato Hoshino ,
Koichi Matsuo  and
Atsushi Momose
Yanlin Wu*
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
Hidekazu Takano
Affiliation:
Japan Synchrotron Radiation Research Institute, Sayo, Japan
Karol Vegso
Affiliation:
Japan Synchrotron Radiation Research Institute, Sayo, Japan
Masato Hoshino
Affiliation:
Japan Synchrotron Radiation Research Institute, Sayo, Japan
Koichi Matsuo
Affiliation:
Keio University School of Medicine, Tokyo, Japan
Atsushi Momose
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan Japan Synchrotron Radiation Research Institute, Sayo, Japan
*
*yanlin.wu.a1@tohoku.ac.jp

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 224 - 225
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Momose, A., et al, SPIE Proc 10391 2017 103910Y.Google Scholar
[2] Kibayashi, S., et al, AIP Conf. Proc 1466 2012 261.CrossRefGoogle Scholar
[3] The experiments were performed in project 2016B1147, 2017A1288, 2017B1361 at BL37XU SPring-8 Japan. This study was financially supported by the ETATO-Momose quantum beam phase imaging project (Grant Number JPMJER1403) of Japan Science and Technology Agency (JST), Japan.Google Scholar