Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-28T15:09:19.914Z Has data issue: false hasContentIssue false
  • English
  • Français

Atom-Probe Microscopy LEAPs the Chasm to Mainstream Applications

Published online by Cambridge University Press:  14 March 2018

Roger Alvis  and
Thomas F. Kelly
Roger Alvis*
Affiliation:
FEI Company
Thomas F. Kelly
Affiliation:
Imago Scientific Instruments
*
Roger.Alvis@fei.com

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

In the now classic marketing text, Crossing the Chasm, Geoffrey Moore describes the difficult transition every successful new technology must make as it evolves from laboratory curiosity to mainstream acceptance. Essentially the transition consists of a radical shift in focus, from exploring the possibilities that fill the minds of visionaries and innovators to satisfying the practical concerns of pragmatists and conservatives who are more interested in integration with existing technologies and return on investment. Initial development of the atom probe was motivated primarily by scientific curiosity and the desire to do novel research with a new microscopy technique. As the technology matured the focus of development efforts shifted to expanding the applications space and improving practical performance in areas such as sensitivity, fidelity, productivity, and ease of use.

Type
Research Article
Information
Microscopy Today , Volume 16 , Issue 5 , September 2008 , pp. 6 - 11
Copyright
Copyright © Microscopy Society of America 2008

References

1 Miller, M. K., Atom Probe Tomography, Kluwar Academic Publishers, New York, (2000).Google Scholar
2 Kelly, T. F. and Larson, D. J., Mat. Char. 44 (2000) 59.Google Scholar
3 Kelly, T. F. et al., Micro Microanal. 10(3) (2004) 373.Google Scholar
4 Thompson, K., Flaitz, P., Ronsheim, P., Larson, D. J. and Kelly, T. F., Science Sept 7 (2007) 1370.Google Scholar
5 Cerezo, A. et al., Materials Today 10(12) (2007).Google Scholar
6 Larson, D. J., Prosa, T. J., S.L.P. Kostrna, Ali, M., Kelly, T. F., Stallybrass, C., Schneider, A., Sauthoff, G. and Degass, J., Microscopy and Microanalysis 12(suppl. 2) (2006) 1748CDGoogle Scholar
7 Larson, D. J. and Kelly, T. F., Microscopy and Analysis 78 (2006) 43.Google Scholar
8 Kelly, T. F. and Miller, M. K., Rev. Sci. Instrum. 78 (2007) 031101.CrossRefGoogle Scholar
9 Thompson, K., Lawrence, D., Larson, D. J., Olson, J. D., Kelly, T. F. and Gorman, B., Ultramicroscopy 107(2-3) (2006) 131.Google Scholar