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Digital Image Tips: Adjusting Brightness And Contrast In Micrographs Using Adobe PhotoshopÆ

Published online by Cambridge University Press:  14 March 2018

Bradley R. Johnson*
Affiliation:
Pacific Northwest National Lab*

Extract

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Recently on the microscopy list server, a question came up as to how to compensate for charging in SEM micrographs. Several good answers were suggested. Some of them were 1) recoating the sample to prevent the build up of charge on the sample in the first place, and image it again, 2) use an environmental SEM (ESEM) in the “wet” mode to eliminate the charging phenomena, 3) use a different detector, such as a backscattered electron detector, which is much less sensitive to charging phenomena, and 4) apply adjustments to the digital image using software such as Adobe PhotoshopÆ to minimize the effect of the charging problem.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2002

Footnotes

*

Pacific Northwest National Laboratory is operated by Battelie Memorial Institute for the U.S. Department of Energy under contract DE-AC06-76RL01830