False Engagements in AFM

Extract

In scanning microscopes, like the Atomic Force Microscope (AFM), used in contact mode, scanning begins with engaging the tip with the sample at some contact force, which can be adjusted by the setpoint* (this is common to Digital Instruments' AFMs). It may differ for other brands. For a system that detects the motion of the cantilever with a laser beam, the setpoint basically gives an idea of the voltage difference between the top and bottom photo detectors, When the tip comes into contact, the feedback circuit adjusts the tip deflection according to the required contact force, This is the method commonly followed for the constant deflection method.